Applied Event-Related Potential Data Analysis (Luck)
- Page ID
- 87922
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- Front Matter
- 1: First Steps
- 2: Processing the Data from One Participant in the ERP CORE N400 Experiment
- 3: Processing Multiple Participants in the ERP CORE N400 Experiment
- 4: Filtering the EEG and ERPs
- 5: Referencing and Other Channel Operations
- 6: Assigning Events to Bins, Averaging, Baseline Correction, and Assessing Data Quality
- 7: Inspecting the EEG and Interpolating Bad Channels
- 8: Artifact Detection and Rejection
- 9: Artifact Correction with Independent Component Analysis
- 10: Scoring and Statistical Analysis of ERP Amplitudes and Latencies
- 11: EEGLAB and ERPLAB Scripting
- 12: Appendix 1: A Very Brief Introduction to EEG and ERPs
- 13: Appendix 2: Troubleshooting Guide
- 14: Appendix 3: Example Processing Pipeline
- Back Matter