Applied Event-Related Potential Data Analysis (Luck)
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Front Matter
1: First Steps
2: Processing the Data from One Participant in the ERP CORE N400 Experiment
3: Processing Multiple Participants in the ERP CORE N400 Experiment
4: Filtering the EEG and ERPs
5: Referencing and Other Channel Operations
6: Assigning Events to Bins, Averaging, Baseline Correction, and Assessing Data Quality
7: Inspecting the EEG and Interpolating Bad Channels
8: Artifact Detection and Rejection
9: Artifact Correction with Independent Component Analysis
10: Scoring and Statistical Analysis of ERP Amplitudes and Latencies
11: EEGLAB and ERPLAB Scripting
12: Appendix 1: A Very Brief Introduction to EEG and ERPs
13: Appendix 2: Troubleshooting Guide
14: Appendix 3: Example Processing Pipeline
Back Matter